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Wafer Surface Particle Scanner – Inspection for Compound & Transparent Wafers | Eumetrys
https://www.eumetrys.com/unpatterned-wafer-default-inspection-@44.html
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Discover the YPI – Clear Scanner™: a high-performance wafer surface particle scanner for compound semiconductors. Detect submicron defects on transparent and unpatterned wafers, from SiC to GaN. Backed by 12+ years of industry experience.
