EUMETRYS: Experts in IVS optical metrology systems
Distributor of optical metrology, particles inspection for transparent and opaque substrates, and layer thickness measurement equipment for compound and standard semiconductor industries.| EUMETRYS
Distributor of optical metrology, particles inspection for transparent and opaque substrates, and layer thickness measurement equipment for compound and standard semiconductor industries.| EUMETRYS
Discover the YPI – Clear Scanner™: a high-performance wafer surface particle scanner for compound semiconductors. Detect submicron defects on transparent and unpatterned wafers, from SiC to GaN. Backed by 12+ years of industry experience.| EUMETRYS
