This work presents a comparative analysis of Complementary Field-Effect Transistor (CFET) and Nanosheet FET (NSFET) architectures, with a focus on self-heating effects (SHE), Negative Bias Temperature Instability (NBTI), Hot Carrier… The post Impact of Aging, Self-Heating and Parasitics Effects on NSFET and CFET appeared first on IEEE Solid-State Circuits Society.
